CSC Fellow Evaluating Committee (FEC)

The CSC Fellow Evaluating Committee performs a technical evaluation of the candidates nominated to be evaluated through CSC. The purpose of this step is to ensure that the technical and professional achievements of a candidate are evaluated by his/her peers. The basic outcome of CSC Fellow Committee evaluation is to place candidates into a single rank-order list where each candidate is given a score. These scores are supported by comments worded by the evaluators.

Bear in mind that:

Reference forms and endorsement letters are not made available to the members of CSC Fellow Committee.
The CSC Fellow Evaluating Committee does not make decisions for elevation to Fellow grade. Such a decision falls to the IEEE Board of Directors.

FEC Chair

Samuel Benz

National Institute of Standards & Technology (NIST)

5 (Southwestern U.S.)

FEC Vice-Chair

Raafat Mansour

University of Waterloo

7 (Canada)

Raafat Mansour

7 (Canada)

Biography

Dr. Raafat R. Mansour received the BSc and MSc degrees from Ain Shams University, Cairo, Egypt in 1977 and 1981, respectively, and the PhD degree from the University of Waterloo, Ontario, Canada in 1986 — all in electrical engineering.

Dr. Mansour is a Professor of Electrical & Computer Engineering at the University of Waterloo and holds a Tier 1-Canada Research Chair (CRC) in Micro-Nano Integrated RF Systems. He held an NSERC Industrial Research Chair (IRC) for two terms (2001-2005) and (2006-2010). Prior to joining the University of Waterloo in January 2000, Dr. Mansour was with COM DEV Cambridge, Ontario, over the period 1986-1999, where he held various technical and management positions in COM DEV’s Corporate R&D Department. Dr. Mansour holds 37 US and Canadian patents (35 awarded, 2 pending) and more than 350 refereed publications to his credit. He is a co-author of the most comprehensive 20-chapter Microwave Filters book published by Wiley and also contributed 6 chapters to four other books. He was the recipient of COM DEV’s Outstanding Achievement Award in 1991 and COM DEV’s CEO Special Award in 1994. He also received several Best Paper Awards and outstanding research performance awards from the University of Waterloo.

Dr. Mansour is the Founding Director of the Center for Integrated RF Engineering (CIRFE) facility at the University of Waterloo cirfe.uwaterloo.ca, which houses a state-of-the-art clean room and RF-MEMS test/characterization laboratory. CIRFE launched the UW-MEMS process, a research-oriented multi-user MEMS fabrication process, and, through the Canadian Microelectronics Corporation (CMC), it has been offering the UW-MEMS as a multi-project wafer university-based fabrication process to researchers across Canada. Dr. Mansour’s research group has made seminal contributions to the field of nano-instrumentation by introducing a new class of scanning probe microscopes (SPM) capable of imaging surfaces at the nano-scale. Dr. Mansour and his graduate students co-founded Integrated Circuit Scanning Probe Instruments (ICSPI-Corp; www.icspicorp.com), a start-up company that commercializes CMOS-MEMS SPM technologies.

Dr. Mansour served as the Chair of the Technical Program Committee of the IEEE International Microwave Symposium IMS2012. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE), a Fellow of the Engineering Institute of Canada (EIC) and a Fellow of the Canadian Academy of Engineering (CAE). Dr. Mansour was the recipient of the 2014 Professional Engineers Ontario (PEO) Engineering Medal for Research and Development.